Physically Unclonable Function Compliant with ISO/IEC 20897-1:2020
TimeWednesday, July 13th5pm - 6pm PDT
LocationLevel 2 Exhibit Hall
Event Type
Engineering Track Poster
Engineering Tracks
Back-End Design
Embedded Systems
Front-End Design
DescriptionPhysically Unclonable Functions (PUFs) are silicon IPs capable of managing cryptographic keys in highly secure contexts:

- The keys are "wiped" when the power is cut, and are regenerated when the power comes back.

- PUFs have made their way in the market and are even now governed by a standard, namely ISO/IEC 20897.

This international standard basically requires the PUF to be reliable and entropic:

- Reliable as the PUF reconstructs the key without error in all PVTA (for Process, Voltage, Temperature, Aging) corners.

- Entropic as the PUF produces random, on-chip keys (key bits are decorrelated) and chip-to-chip keys (keys are decorrelated).

For mission-critical applications (automotive with EVITA compliance, IIoT, space, etc.), reliability shall be commensurable with highest safety levels (SIL 4, ASIL D).
Reliability can be improved at the expense of entropy -- basically, unreliable PUF challenges are discarded, only the most reliable ones remain.

In this talk, I will present a PUF IP which complies both in terms of reliability and entropy, across various corners. The design leverages a "stochastic model" to predict metrics based on technological dispersion (estimated by Monte-Carlo simulations) and dynamic noise (measured). The reliability and entropy metrics are subsequently verified on several designs (in FPGA, ASIC in CMOS/FD-SOI/FinFET), evaluated under extreme PVTA conditions.