Variation-Aware Design Verification For Automotive Semiconductor IP
TimeTuesday, July 12th1:45pm - 2pm PDT
Location2012, Level 2
Event Type
Engineering Tracks
DescriptionThe role of semiconductor content in automotive parts has increased significantly in recent years, demanding higher functional safety verification and increased simulation automation. Most automotive semiconductor designs today are mission-critical and require variation-aware simulation methods with a high level of coverage and accuracy to meet stringent regulations and ensure operational safety. This often renders brute-force Monte Carlo approaches impractical due to compute and runtime limitations.
This paper describes the design and verification of a voltage and temperature insensitive free-running RC oscillator used as a mission-critical boot clock and system monitor in a high-performance automotive application. A machine learning-enabled method for diagnosing a potential yield problem using variation-aware design verification methods enabled fundamental improvements in the design for high-sigma reliability and full PVT coverage, while reducing simulation runtime significantly.
This approach also provides design sensitivity analysis and re-verification with optimized parameters, to improve overall yield and design robustness.