TailCut: Improving Performance and Lifetime of SSDs using Pattern-Aware State Encoding
TimeTuesday, July 12th5:10pm - 5:30pm PDT
Location3004, Level 3
Event Type
Research Manuscript
Embedded Memory, Storage and Networking
Embedded Systems
DescriptionAlthough lateral charge loss is considered as a dominant error source in 3D NAND flash memory, little is known about its detailed characteristics at the storage system level. From a device characterization study, we observed that lateral charge loss strongly depends on vertically adjacent state patterns and a few specific patterns are responsible for a large portion of bit errors from lateral charge loss. We propose a new state encoding scheme, called TailCut, which removes vulnerable state patterns by modifying encoded states. By removing vulnerable patterns, TailCut can improve the SSD lifetime and read latency by 35% and 29%, respectively.