Qualification of Metamorphic Relations for System Level AMS Models using Data Flow Coverage
TimeWednesday, July 13th6pm - 7pm PDT
LocationLevel 2 Lobby
DescriptionRecently, Metamorphic Testing (MT) has been applied successfully to the verification of Radio Frequency (RF) amplifiers and Phase-Locked Loops (PLL) at the system level. However, the crucial question regarding the quality of Metamorphic Relations (MRs) has not been considered so far. In this paper we propose a novel qualification methodology which uses data flow coverage to analyze the quality of MRs for system level AMS models. Furthermore, we go beyond the verification and perform qualitative analysis of the devised MRs using data flow coverage metrics. Our experimental results demonstrate the applicability and efficacy of our analysis.