Research Manuscript: Repeal Murphy's Law: Avoid Errors
Event TypeResearch Manuscript
Manufacturing Test and Reliability
TimeWednesday, July 13th3:30pm - 5:30pm PDT
Location3007, Level 3
DescriptionRobust designs are always desired. This session helps push state of the art in this area by introducing fault-tolerant designs with Winograd convolution and SEU-tolerant latches, pioneering the deployment of defect tolerance and defect-aware synthesis to improve yield, developing aging and variation-aware dynamic timing analyzer and an application-based dynamic-voltage-accuracy-frequency-scaling (DVAFS) design flow, and enabling resilient analog in-memory deep learning via data layout re-organization.