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Session

Research Manuscript: Novel approaches for scaling routing and DFM challenges
Event TypeResearch Manuscript
Keywords
Physical Design and Verification, Lithography and DFM
Topics
EDA
TimeThursday, July 14th10:30am - 12:00pm PDT
Location3007, Level 3
DescriptionThis session focuses on novel approaches for routing and lithography modeling. The first paper presents a new flip-chip router based on Y-architecture. The second paper introduces a federated learning based method for routability estimation. The third paper presents a GPU-accelerated framework equipped with spatial attention for inverse lithography technology, while the last paper introduces a fast neural network based method for lithography simulation.